An Improved Emission Tomographic Measurement System Device and a Method Thereof
Non-Confidential description of the invention
Invention is an improved imaging system or an improved emission tomographic measurement device for compact plasma systems. It is portable and data is collected directly from plasma facing surface. It provides a compact size camera for collecting prominent emission line from direct plasma facing surface. The Camera has provision to change different filters for desired emission line profiles. Real time imaging of the plasma is possible by computer controlled movement of the camera ring along the axial direction of the plasma cross section.
Ms.kavita rathore,Research Scholar,ME, Prof.Prabhat Munshi,ME, Prof.Sudeep Bhattacharjee,Physics
Date of Filing